The JEOL JSM-6380LA scanning electron microscope is equipped with an EDS microanalyzer and a low vacuum mode. The device enables structure observation and microanalysis of the elemental composition of samples with a diameter and height of up to 10 cm, both electrically conductive and dielectric (with a hydration level of less than 3%). Additionally, an ion sputtering machine is available to metalize non-conductive samples as an alternative to using a low vacuum system.

The basic technical data of the JSM-6380LA are:

  • Variable accelerating voltage in the range of 300V – 30 kV,
  • The range of real hangers 15x – 100,000x
  • The range of qualitative and quantitative analysis of elements from B to U
  • Possibility to make maps, X-ray profiles and point analysis.

The service provides 24/7 technical support by phone.